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SJ Wayside Inspection System for Pantograph and Roof Condition

SJ Dynamic Inspection System for Pantograph and Roof Condition

SJ Wayside Inspection System for Pantograph and Roof Condition

SJ  is installed at the entrance line of EMUs depot, Using image measurement technology and intelligent sensing technology, it can dynamically and automatically detect the pantograph wear value, centerline deviation value and working position contact pressure value of all types of EMUs on-line, so as to realize the visual observation of key components on the roof and foreign matters on the roof.  

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